广州按摩会馆|广州小姐务
Phone400-615-4535 E-mail[email protected]

技術支持 Technologies

橢偏儀技術

發布者:眺望科技                     發布日期:2018-03-30

he FS-1 uses the power of ellipsometry to optically characterize samples.  In an ellipsometer system, the Polarization State Generator (PSG) emits light with a known polarization, which is obliquely incident on the sample, and the Polarization State Detector (PSD) measures the polarization state of the light reflected from the sample.

1.jpg

The change in polarization state caused by the sample reflection can be defined by the ratio of the sample reflectivity for p-polarized light (Rp), over the sample reflectivity for s-polarized light (Rs).  This ratio is a complex number, which is typically denoted by ρ (rho), and is often reported in terms of the ellipsometric parameters Ψ (Psi) and Δ (Delta), as defined by the following equation.  According to this equation, tan(Ψ) defines the magnitude of the reflectivity ratio for p- and s- polarized light, and Δ defines the phase difference between the reflected p- and s- polarized light.

2.jpg

An alternate representation of the ellipsometric parameters is shown below. The N, C, and S ellipsometric parameters can be calculated in terms of the Ψ (Psi) and Δ (Delta) parameters, assuming the sample is isotropic and non-depolarizing. One of the advantages of the N,C,S representation of the ellipsometric parameters is that if the sample is depolarizing, the degree of polarization P can also be reported.

3.jpg

The ellipsometric parameters measured on the sample (and reported in either the Ψ/Δ or N,C,S representation) can be further analyzed to determine sample properties of interest, such as film thicknesses and optical constants.

 

400-615-4535
400-615-4535
广州按摩会馆 黑色沙漠造船赚钱 跟十二生肖有关的游戏 易11选5现场开奖结果 成熟的股票指数 时时彩官方最快开奖 广东11选5网站 bbin波音根本不能玩 新疆时时彩开奖号码 北京pk赛车搞假吗 北京pk赛车是正规的吗 王者传奇伙伴升级数据 大乐透红球中4个号 原创稳赚包六肖 重庆时时单双大小 十二生肖游戏赚钱 快乐飞艇是官方彩吗